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Wafer Level Reliability of Advanced CMOS Devices and Processes

 

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Type:Hardcover
ISBN:1604567139
Publisher:Nova Science Publishers Inc
Number of items:1
Number of pages:195
Publication date:2008-12-01
Subjects:Semi-conductors & super-conductors, Metal oxide semiconductors, Complementary, Technology & Engineering / Electronics / Semiconductors, Electronics - Semiconductors, Life Sciences - General, Science, Science/Mathematics, Technology & Industrial Arts, Electronics Engineering & Communications Engineering
Product Dimensions:Height: 1.80cm