Reliability of MEMS: Testing of Materials and Devices (Advanced Micro and Nanosystems)

 

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Type:Hardcover
ISBN:3527314946
Publisher:Wiley VCH
Number of pages:324
Publication date:2007-12-12
Subjects:Electronics & communications engineering, Mechanical engineering & materials, Electronics Engineering & Communications Engineering, Electronics engineering, Engineering (Electronic), Material Science, Materials science, Microelectromechanical systems, Reliability, Science/Mathematics, Technology & Engineering, Technology & Engineering / Material Science
Product Dimensions:Height: 2.01cm
Length: 24.41cm